Description

• Unique ARL EQUINOX curved detector measures all diffraction peaks simultaneously across a wide angular range. Analysis is completed in just a few minutes on most samples regardless of resolution requirements.
• Same configuration between ARL EQUINOX 3000 and ARL EQUINOX 3500 with a respective real-time detection over 120° 2Ø and 90° 2Ø
• Better resolution with ARL EQUINOX 3500 Diffractometer thanks to a bigger radius of CPS detector in comparison of ARL EQUINOX 3000 Diffractometer
• No scanning required
• Resolute or fast monochromatic optic
• Many sample holders are available for: powders transmission and reflection mode, bulks, thin films, automated analysis with a sample changer, as well as in-situ studies
• Treatment and applications: Phase identification, Quantification, Degree of crystallinity, Cell parameters, Crystallite size, Lattice strain, Crystal structure, Rietveld analysis, Transition phase, Thin film analysis (GIXRD, XRR)
• Domains of application: Materials Science, Minerals, Geology, Nanomaterials, Chemicals, Pharmaceuticals, Energy materials, Catalysts, Ceramics, Polymers, Metallurgy, Semiconductors, Mining (cement, …), Teaching