X-Ray Diffraction (XRD)

Quickly obtain detailed structural and phase information of materials using x-ray diffraction (XRD), a versatile, nondestructive analytical technique. XRD analysis provides high-performance results in a wide range of industrial and research applications including academic research, chemicals, pharmaceuticals, polymers, semiconductors, thin films, metals and minerals.

ARL™ EQUINOX 100 X-ray Diffractometer

Get a dedicated XRD system for QA/QC, academic, and routine applications with the compact, affordable Thermo Scientific™ ARL™ EQUINOX 100 X-ray Diffractometer. This transportable bench top instrument offers true flexibility.

ARL Equinox 100

ARL™ EQUINOX 1000 X-ray Diffractometer

Experience real-time measurement in a simple yet powerful benchtop XRD analyzer. The Thermo Scientific™ ARL™ EQUINOX 1000 X-ray Diffractometer offers maintenance free, simplified operation for QA and routine XRD studies.

ARL Equinox 1000

ARL™ EQUINOX 3000 X-ray Diffractometer

Experience fast, accurate measurements with the Thermo Scientific™ ARL™ EQUINOX 3000 X-ray Diffractometer. This research-grade diffraction system provides high resolution detectors, a large sample area, and choice of X-ray sources.

ARL Equinox 3000

ARL™ EQUINOX 5000 X-ray Diffractometer

Perform phase identification and quantification and structural analysis of polycrystalline materials. The Thermo Scientific™ ARL™ EQUINOX 5000 X-ray Diffractometer can be customized for applications requiring a four circle goniometer.

ARL Equinox 5000

ARL™ EQUINOX 6000 X-ray Diffractometer

Perform advanced analyses and combined studies in real time. The Thermo Scientific™ ARL™ EQUINOX 6000 X-ray Diffractometer provides thin layer analysis, reflectometry, micro-diffraction, residual stress analysis, and texture measurements.

ARL Equinox 6000

ARL™ X’TRA Powder Diffractometer

Get qualitative and quantitative analysis of polycrystalline materials. The Thermo Scientific™ ARL™ X’TRA Powder Diffractometer can be customized for phase transitions and structural investigations at low and high temperatures, nonambient atmosphere, on thin films and small samples.

ARL Xtra